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SystmRez 2308
COMPLETE 4 POINT PROBE SYSTEM
The SystmRez system includes everything needed to make 4 point probe measurements

AutoRez 2101

RESISTIVITY MEASUREMENT SYSTEM

SHEET RESISTIVITY
1 milliohm per square to 10 megohms per square.

BULK RESISTIVITY
Program substrate thickness up to 100 mils.

READOUT DIRECTLY IN OHMS / SQUARE
From 1 milliohm per square to 10 megohms per square.

PowrRez 2208B
FOUR POINT PROBE STATION

POWERED PROBE DOWN
Smooth Z motion with PCC's exclusive SofTouch™ design.

POWERED THICKNESS SET
From thin wafers to 600 mil substrates.

VACUUM CHUCK FOR 8" (200 mm) WAFERS
Up to 8" (200 mm) wafers securely held on the chuck.

VersaRez 2021
ADJUSTABLE FOUR POINT PROBE HEAD

ADJUST THE FORCE
Dial in the force from 40 to 180 grams / tip.

REPLACE THE PROBE TIPS
Easy to remove, easy to re-insert.


SystmRez 2308 - COMPLETE 4 POINT PROBE SYSTEM

Note: The three components of this system are available separately and can be used with other manufactures' equipment. Please see more detailed descriptions on the following pages.