| SystmRez 2308
COMPLETE 4 POINT PROBE SYSTEM
The SystmRez system includes everything needed to make 4 point probe measurements
RESISTIVITY MEASUREMENT SYSTEM
1 milliohm per square to 10 megohms
Program substrate thickness up to 100 mils.
READOUT DIRECTLY IN OHMS / SQUARE
From 1 milliohm per square to 10 megohms
FOUR POINT PROBE STATION
POWERED PROBE DOWN
Smooth Z motion with PCC's exclusive SofTouch™ design.
POWERED THICKNESS SET
From thin wafers to 600 mil substrates.
VACUUM CHUCK FOR 8" (200 mm) WAFERS
Up to 8" (200 mm) wafers securely held on the chuck.
ADJUSTABLE FOUR POINT PROBE HEAD
ADJUST THE FORCE
Dial in the force from 40 to 180 grams / tip.
REPLACE THE PROBE TIPS
Easy to remove, easy to re-insert.
Note: The three components of this system are available separately and can be used with other manufactures' equipment. Please see more detailed descriptions on the following pages.