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Process Control

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1 Film Thickness Measurement Systems
2 SystmRez 2308 - Complete 4 Point Probe System
3 PowrRez 2208B - 4 Point Probe System
4 AutoRez 2101 - Resistivity Measurement System
5 VersaRezTM - Adjustable 4 Point Probe Head

Process Control Corporation has been designing and building unique electromechanical equipment for use in semiconductor MEMs and optoelectronic manufacturing, development and test since 1979.

Our equipment was developed to be compact, basic, and very user friendly, consequently it is low-cost.

PCC equipment is designed to be used in:
  • Incoming inspection
  • In-process evaluation and process control
  • Failure analysis
  • Engineering development