MERCURY PROBES are precision instruments that enable rapid, convenient,
and non-destructive measurements of semiconductor samples by probing
wafers with mercury to form contacts of well-defined area.
MDC MERCURY PROBES may be connected to C-V
plotters, computerized semiconductor measurement systems, curve
tracers, or doping profilers for a variety of measurements. MERCURY
PROBES eliminate time consuming metallization and their convenience
make them ideal tools for production process monitoring applications.
Their accuracy and reproducibility make them attractive for R&D
There are 2 types of Mercury Probes available. Standard and Mapping
versions. All MDC Mercury Probes have 3 function contacts with the
unique MDC dot-ring configuration. This allows contact to be made
in both front-back and front-front modes allowing for measurements
on semi-insulating substrates. Also, a guard ring can be configured.
The standard probes come in 3 sizes. 3", 6", and 8" diameters. The
Mapping Mercury Probe allows for repeatable contacts over a wafer
using X and Y controls. Mapping Mercury Probes come 8" and 12" diameters.
Nominal contact diameter is 760 microns.
Special diameter platforms or contact areas are available.